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In particular it is generally possible to find original magmatic domains yielding concordant ages.In contrast, destructive techniques such as LA-ICP-MS consume a large volume, leave a deep crater in the target grain, and often sample heterogeneous domains that are not visible and thus often yield discordant results which are difficult to interpret.The difference between the nominal extraction potential (= 10 k V, equivalent to 0 V offset) and the maximum of the observed energy distribution measured on a standard zircon determines the offset voltages to be applied during analysis.For the example to the right, offset values for Centering the secondary ion image in the center of the field aperture (FA) is necessary for each new analysis spot because primary beam paths and conditions of secondary ion extraction vary over the area of the sample surface,in particular when spot-to-spot movements over large distances (few mm) are required. We carried out SHRIMP zircon dating, Hf-in-zircon isotopic analysis and a whole-rock geochemical study on igneous and metasedimentary rocks recovered from drill holes that penetrated into the basement of the CHB.Two samples of gneissic granodiorite (XG1-1) and gneissic quartz diorite (J48-1) have magmatic ages of 25 Ma, respectively. SHRIMP is used for many diverse purposes: to date minerals by U-Th-Pb dating; analyse stable isotopes (eg carbon, sulphur and oxygen) in biogenic and inorganic materials; to look at isotope anomalies in meteorites and lunar soil.

The mass spec bit of the SHRIMP makes up the bulk of the machine. The secondary ion beam (that is, the ions sputtered from the sample) travel through an electrostatic analyser (ESA, just like in the SSAMS, but bigger).

ion bombardement is significantly enhanced if the sample surface is saturated with regard to oxygen.

During zircon analysis, oxygen gas is leaked through a valve into the ims1270 sample chamber. Note: in order to open EP10, EP11 or to vent the door, the leak valve has to be closed (1.5 turns clockwise).

The mount has to be polished and coated with conductive material (eg gold or aluminium) to prevent charge build up. A focussed primary beam of oxygen or caesium ions are focussed to a 10-30 micron (0.01-0.03 mm) spot on the sample.

This sputters material from the surface of the sample, some of which is ionised.